KEITHLEY 238 LABVIEW DRIVER

This resistivity equation already includes the first-order wafer thickness correction factor. Auto-ranging, integration time, averaging, and sweep delay can also be changed on the fly. This works well, and I would like to have a TDMS output file of the measurements as a record of my current source falling over time cold field emission electron microscope instead of the relative values, I tried getting data-logging to work from the LabView menu but without success. The F5 indicator will flash on screen. This button will open a file dialog to save the I-V data. This back-and-forth sweeping can be repeated several times.

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The graph will be updated upon completion of the sweep. Save this file, then re-load the I-V software. In particular, failure to set the instrument's compliance and output-off state as instructed can result in damage to the SMU and the battery. To load prior trace data, use the "Load Data" button.

In this mode, except for the initial RESET command, no other commands are automatically generated by the software. labbview

Message 2 of 3. Be careful when using "source I, measure V" modes. The instrument will reboot if switching from GPIB mode. I have attached a picture of the current scan setup to the loop. Specifically, this pabview controls the delay between changing the bias level and beginning the reading s.

Keithley High Current Source Measure Un - Instrument Driver - National Instruments

Regardless of type, you will need to find and install the appropriate drivers. Message 4 of 5. Auto-suggest helps you quickly narrow down your search results by suggesting possible matches as you type. This is useful for measuring the exponential I-V behavior of diodes.

Hi, i'm a keithley and user. However, in programs using "fixed level pulse. F5first configure and perform the desired measurement.

Could anyone help me? Upon launching, the I-V software will attempt communicating with the instrument.

Keithley ke238 Power Supply

This software is provided for free. This is particularly useful for 4-probe measurements with 23X-series instruments. Bulk semiconductors and contacts: The value of C has been analyzed extensively for various test geometries the "Haldor-Topsoe geometric factors" ; as of ieithley writing, two online resources can be found here and here. This software uses the general equations for sheet resistance and resistivity shown above labeled "otherwise".

Config delay is a software setting that specifies the approximate time delay between preparing the SMU for a sweep, and commanding the start of the sweep. Message 7 of Alternately, you may mail me one million dollars in small, unmarked bills. The "flicker" parameter sets this threshold. Store graph zoom preset.

Keithley ke Power Supply - IEEE (GPIB) Driver for LabVIEW - National Instruments

Double-click the ieithley cell analysis button to automatically scale the graph on the region of photovoltaic power generation.

Operating the equipment discussed herein, with or without the use of the I-V Software, might expose you or others to electrical hazards that can result in injury or death, and might also result in keirhley to the equipment, destruction of connected devices, or fire. Message 10 of The software can try to detect suspicious PV analysis results, by looking for non-monotonic fluctuations in photocurrent.

In practice, I have found the time values to be sufficiently accurate for all applications meithley to date. When sourcing current and measuring voltage, the contact threshold specifies a voltage below which contact occurs. Another useful application of cyclic sweeping is to verify the validity of certain challenging sweeps in which hysteresis is not expected, but might occur due to poor measurement setup.